Titre : | X-Ray Optics and X-Ray Microanalysis | Type de document : | texte imprimé | Auteurs : | H. H. Pattee, Auteur ; V. E. Cosslett, Collaborateur ; Arne Engström, Collaborateur | Importance : | 1 online resource (641 p.) | ISBN/ISSN/EAN : | 978-1-4832-3322-2 | Note générale : | Print version record | Langues : | Anglais | Index. décimale : | 537.5 Electronique théorique | Résumé : | X-ray Optics and X-ray Microanalysis covers the proceedings of the Symposium on X-ray Optics and X-ray Microanalysis, held at Stanford University on August 22-24, 1962. The book focuses on X-ray microscopy, microradiography, radiation and irradiation, and X-ray microanalysis. The selection first offers information on the methods of X-ray microscopy and X-ray absorption microanalysis. Discussions focus on X-ray scanning microscopy, contact microradiography, point projection microscopy, and total dry-weight determinations. The text then takes a look at X-ray microanalysis in biology and medicin .. |
X-Ray Optics and X-Ray Microanalysis [texte imprimé] / H. H. Pattee, Auteur ; V. E. Cosslett, Collaborateur ; Arne Engström, Collaborateur . - [s.d.] . - 1 online resource (641 p.). ISBN : 978-1-4832-3322-2 Print version record Langues : Anglais Index. décimale : | 537.5 Electronique théorique | Résumé : | X-ray Optics and X-ray Microanalysis covers the proceedings of the Symposium on X-ray Optics and X-ray Microanalysis, held at Stanford University on August 22-24, 1962. The book focuses on X-ray microscopy, microradiography, radiation and irradiation, and X-ray microanalysis. The selection first offers information on the methods of X-ray microscopy and X-ray absorption microanalysis. Discussions focus on X-ray scanning microscopy, contact microradiography, point projection microscopy, and total dry-weight determinations. The text then takes a look at X-ray microanalysis in biology and medicin .. |
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